详细摘要： Hiden’s XBS system provides in-situ monitoring of multiple sources with real-tim...

详细摘要： 品牌：Hiden 型号：TOF-qSIMS 制造商：Hiden Analytical Ltd 产地： 英国

详细摘要： A system for the analysis of secondary positive and negative ions from solid sam...

详细摘要： Pascal Sputtering system is suitable For Accurate Multi Layer Deposition，Higher ...

详细摘要： The laser MBE is very suitable for the atomic layer controlled growth of oxides ...

详细摘要： The IG20 features a high brightness electron impact gas ion source which is desi...

详细摘要： The IG5C features a low power, high brightness, surface ionisation source couple...

详细摘要： The Hiden MAXIM quadrupole SIMS analyser is a state of the art secondary ion mas...

详细摘要： The Hiden MAXIM quadrupole SIMS analyser is a state of the art secondary ion mas...

详细摘要： The Hiden SIMS Workstation provides for high performance static and dynamic SIMS...

详细摘要： The TPD Workstation features a multiport UHV chamber with heated sample stage co...

详细摘要： The IMP-EPD is a differentially pumped, ruggedised secondary ion mass spectromet...

详细摘要： The EQP system directly measures mass and energy of both positive and negative p...

详细摘要： Hiden plasma probes measure some of the key plasma parameters and provide detail...

详细摘要： The HPR-30 is a residual gas analyser configured for analysis of gases and vapou...